![]() The Keyence focus stacking technology produces crisp focused optical images far beyond the capability of standard stereo-optical microscopes. Imaging and surface mapping can be performed from 20-2000X magnifications and stitched over large surface area. The Keyence VHX 6000 is a digital optical microscope and surface mapping instrument. Oxford EBSD is available on the MIRA3 electron microscope. Using the NordlysNano high speed, high special resolution camera, combined with sophisticated pattern recognition algorithms, the Oxford EBSD system can identify and map polycrystalline crystal orientation to determine a number of material properties and processing factors. Oxford EDS is available on the VEGA3 and MIRA3 electron microscopes.Įlectron Backscatter Diffraction (EBSD) is technique that uses the elastic scattering of the electron beam in the SEM to produce characteristic diffraction patterns, unique to each crystal type. Coupling the Oxford X-Max, liquid nitrogen free detectors with Oxford’s Aztec software platform allows the SEM user to study the presence of different elements and chemical species, map their layout in the microstructure and perform semi-quantitative composition analysis. The VEGA3 is also equipped with Oxford EDS for elemental analysis and X-ray Mapping.Įnergy Dispersive Spectroscopy (EDS) provides elemental and chemical analysis by analyzing the x-rays produced in the electron microscope. The VEGA3, like all Tescan SEM’s features unique wide field optics and In Flight Beam Tracing. The Tescan VEGA3 is a scanning electron microscope with a tungsten filament electron source and variable pressure operation mode making it ideal for high magnification analysis of conductive and non-conductive specimens. In addition, the MIRA3 is equipped with Oxford EDS and EBSD for elemental analysis, phase ID, x-ray mapping and crystallographic characterization. The microscope features advanced imaging capabilities such as in lens detectors for SE and BSE, Low Energy BSE, Inflight Beam Tracing, Beam Deceleration and a host of measurement and topographic assessment capabilities. This microscope is equipped with an extra-large sample chamber, and X-Y-Z tilting/rotating stage that can hold up to 18 pounds. The Tescan MIRA3 is a scanning electron microscope capable of extreme magnification, thanks to the field emitter used as the source of electrons. ![]() Our partnerships with Tescan, Oxford and Shimadzu afford a variety of materials, characterization methods and techniques. Where “Z” is the impedance in ohms, “R” is resistance in Ohms and “X” is the reactances in Ohms.MSERF offers a variety of materials characterization and testing methodologies, giving users the ability to explore the structure-processing-property relationships of materials. resistive, captative and inductive circuit (already mentioned above). ![]() Impedance is the resistance of AC circuits i.e.
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